Listar Escuela de Ingeniería Electrónica por autor "Ing. Leonardo Rivas Arce"

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Diseño del sistema de control tipo batch para las pruebas de vida útil de 10A 10/1000 s de los componentes GDT

Castro-González, Alberto (Instituto Tecnológico de Costa Rica, 2018)

The 10x1000 s lifetest are quality control processes performed on the GDT components. The system in charge of recreate this tests in the company is very old and show important deficiencies in the process. Among them, the ...